You will use production wafer-fab experience to review semiconductor defects and yield data for AI training. The work includes making evidence-based decisions about defect causes, excursion events, and lot status, then explaining your findings clearly.
- Review SEM findings from wafer-fabrication processes and classify defects accurately.
- Analyze yield-loss mechanisms and connect defect patterns to process issues.
- Evaluate excursion events and recommend lot holds or releases using evidence and established industry practices.
- Interpret and annotate wafer sort and test-floor data, including bin maps and parametric datasets.
- Identify defect paretos and support source-attribution analysis to trace root causes.
- Document observations and provide concise technical feedback for AI learning modules.