Artefact-Aware Fungal Detection in Dermatophytosis: A Real-Time Transformer-Based Approach for KOH Microscopy

ataset of 2,540 routinely acquired microscopy images was manually annotated using a multi-class strategy to explicitly distinguish fungal elements from confounding artefacts. The model was trained with morphology-preserving augmentations to maintain the structural integrity of thin hyphae. Evaluation on an independent test set demonstrated robust object-level performance, with a recall of 0.9737, precision of 0.8043, and an AP@0.50 of 93.56%. When aggregated for image-level diagnosis, the model achieved 100% sensitivity and 98.8% accuracy, correctly identifying all positive cases without missing a single diagnosis. Qualitative outputs confirmed the robust localization of low-contrast hyphae even in artefact-rich fields. These results highlight that an artificial intelligence (AI) system can serve as a highly reliable, automated screening tool, effectively bridging the gap between image-level analysis and clinical decision-making in dermatomycology.