Algorithm Developer — MES Data Analytics (alarm/event NLP clustering and correlation)
Developed Transformer-based NLP analytics to cluster and correlate semiconductor MES alarm and event text across multiple sources for faster root-cause identification. Correlated initiating alarms with process run data to map relevant sensor parameters within event windows and highlight recurring failure patterns. Used the outputs to support yield-loss prevention and improved tool uptime during wafer fabrication. • Input: alarm/event text streams from MES and equipment systems • Labeling/annotation goal: deriving structured alarm groups, initiating event identification, and associated process/sensor attributes • Output artifacts: correlated alarm sequences, anomaly signatures, and reporting for engineers • Impact: reduced repetitive excursions and accelerated troubleshooting of yield-impacting tool issues