Inspection Process Engineer — Image Annotation & ML Pipeline
Created and curated large-scale annotated datasets of SiC wafer X-ray topography images to train defect detection models. Performed pixel-level segmentation annotation of micropipe defects while defining labeling guidelines and quality standards for the team. Validated annotation consistency through cross-checking and iterative refinement to achieve high inter-annotator agreement. • Image segmentation (pixel-level) for micropipe defects • Dataset curation for defect detection training • Quality assurance via cross-checking and iterative refinement • Labeling criteria for low-SNR edge cases and ambiguous samples