University of Cambridge — Graduate Researcher (Machine Learning for Nano and Device Materials Electron Microscopy Signal Analysis)
Developed large-scale paired electron microscopy datasets and established standardized preprocessing, labeling, and quality control pipelines. Implemented end-to-end deep learning workflows for automated image reconstruction and analysis, including defect detection and denoising. Applied evaluation metrics and segmentation-quality improvements (e.g., patch-based blending, PSNR/SSIM, perceptual loss) to robustly enhance reconstructed image fidelity. •Built and curated 22,000+ paired electron microscopy image dataset.•Performed data preprocessing, labeling, and quality control in standardized pipelines.•Developed automated microscopy reconstruction and defect detection models.•Improved output quality using PSNR/SSIM and perceptual loss with patch-based blending.